transistor: be damaged

from Quasimodo
0.2 0.4 0.6 0.8 Plausible Typical Remarkable Salient

Related concepts

Parents electronic device
Weight: 0.65
, semiconductor
Weight: 0.64
, electrode
Weight: 0.60
, device
Weight: 0.59
Siblings capacitor
Weight: 0.62
, fet
Weight: 0.42
, silicon
Weight: 0.38
, silicon carbide
Weight: 0.37
, diode
Weight: 0.37

Related properties

Property Similarity
be damaged 1.00
be damaged by current 0.94
be damaged by strong current 0.89

Priors about this statement

Cues

0.2 0.4 0.6 0.8 Joint Necessity Sufficiency Implication Entailment Contradiction Entropy

Evidence

0.2 0.4 0.6 0.8 Plausible Typical Remarkable Salient

Clauses

Plausibility inference from child typicality

0.24
Rule weight: 0.66
Evidence weight: 0.39
Similarity weight: 0.94
Evidence: 0.06
Plausible(semiconductor, be damaged by current) ⋁
Evidence: 0.64
¬ Typical(transistor, be damaged)
0.23
Rule weight: 0.66
Evidence weight: 0.38
Similarity weight: 0.89
Evidence: 0.04
Plausible(semiconductor, be damaged by strong current) ⋁
Evidence: 0.64
¬ Typical(transistor, be damaged)

Plausibility inheritance from parent to child

0.09
Rule weight: 0.09
Evidence weight: 0.97
Similarity weight: 0.94
Evidence: 0.51
Plausible(transistor, be damaged) ⋁
Evidence: 0.06
¬ Plausible(semiconductor, be damaged by current)
0.08
Rule weight: 0.09
Evidence weight: 0.98
Similarity weight: 0.89
Evidence: 0.51
Plausible(transistor, be damaged) ⋁
Evidence: 0.04
¬ Plausible(semiconductor, be damaged by strong current)

Remarkability exclusitivity betweem a parent and a child

0.53
Rule weight: 0.58
Evidence weight: 0.98
Similarity weight: 0.94
Evidence: 0.38
¬ Remarkable(transistor, be damaged) ⋁
Evidence: 0.06
¬ Remarkable(semiconductor, be damaged by current)
0.50
Rule weight: 0.58
Evidence weight: 0.98
Similarity weight: 0.89
Evidence: 0.38
¬ Remarkable(transistor, be damaged) ⋁
Evidence: 0.04
¬ Remarkable(semiconductor, be damaged by strong current)

Remarkability from parent implausibility

0.28
Rule weight: 0.42
Evidence weight: 0.70
Similarity weight: 0.94
Evidence: 0.06
Plausible(semiconductor, be damaged by current) ⋁
Evidence: 0.38
Remarkable(transistor, be damaged) ⋁
Evidence: 0.51
¬ Plausible(transistor, be damaged)
0.26
Rule weight: 0.42
Evidence weight: 0.69
Similarity weight: 0.89
Evidence: 0.04
Plausible(semiconductor, be damaged by strong current) ⋁
Evidence: 0.38
Remarkable(transistor, be damaged) ⋁
Evidence: 0.51
¬ Plausible(transistor, be damaged)

Salient implies Plausible

0.22
Rule weight: 0.28
Evidence weight: 0.78
Similarity weight: 1.00
Evidence: 0.51
Plausible(transistor, be damaged) ⋁
Evidence: 0.45
¬ Salient(transistor, be damaged)

Typical and Remarkable implies Salient

0.12
Rule weight: 0.14
Evidence weight: 0.87
Similarity weight: 1.00
Evidence: 0.45
Salient(transistor, be damaged) ⋁
Evidence: 0.64
¬ Typical(transistor, be damaged) ⋁
Evidence: 0.38
¬ Remarkable(transistor, be damaged)

Typical implies Plausible

0.33
Rule weight: 0.48
Evidence weight: 0.69
Similarity weight: 1.00
Evidence: 0.51
Plausible(transistor, be damaged) ⋁
Evidence: 0.64
¬ Typical(transistor, be damaged)

Typicality and Rermarkability incompatibility between a parent and a child

0.43
Rule weight: 0.51
Evidence weight: 0.90
Similarity weight: 0.94
Evidence: 0.38
¬ Remarkable(transistor, be damaged) ⋁
Evidence: 0.27
¬ Typical(semiconductor, be damaged by current)
0.41
Rule weight: 0.51
Evidence weight: 0.91
Similarity weight: 0.89
Evidence: 0.38
¬ Remarkable(transistor, be damaged) ⋁
Evidence: 0.25
¬ Typical(semiconductor, be damaged by strong current)

Typicality inheritance from parent to child

0.41
Rule weight: 0.48
Evidence weight: 0.90
Similarity weight: 0.94
Evidence: 0.64
Typical(transistor, be damaged) ⋁
Evidence: 0.27
¬ Typical(semiconductor, be damaged by current)
0.39
Rule weight: 0.48
Evidence weight: 0.91
Similarity weight: 0.89
Evidence: 0.64
Typical(transistor, be damaged) ⋁
Evidence: 0.25
¬ Typical(semiconductor, be damaged by strong current)